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1 and 2 Fast Track Bluetooth Hardware & CSR simplifying Prod.pdf

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1 and 2 Fast Track Bluetooth Hardware & CSR simplifying Prod.pdf

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The Single Chip Bluetooth® Company Agenda • CSR Japan RF Application Engineering Group • Fast Track Bluetooth Hardware • Generic Production Test 2 CSR Japan RF Application Engineering Group Technical Seminar Presentation September 2003 3 CSR Japan Organization Administration Kaoru Nakajima Chiyo Hirai President Aki Tsukagoshi Quality Assurance Manager Hiroshi Fukuda Senior Manager, Application Naoki Matsuda Senior Field Application Engineer Kentaro Sugama Toshiyuki Kojima Yosuke Ueshima Field Application Engineer Maki Uchida RF Application Engineering Group Atsushi Nagao Takao Sakurai Manabu Kato Senior Manager, Sales Bob Sato Senior Field Sales Engineer David Fukada 4 RF Expertise Takao Sakurai Senior Application Engineer/Production Test Specialist 20 years RF (Production Process) Experience Manabu Kato Application Engineer/Design Specialist 10 years RF (Mobile Phone) Experience Atsushi Nagao Team Leader/Design Specialist 15 years RF (MMIC and Module) Experience 5 CSR Japan Laboratory 6 CSR Japan Test Equipments 1. Loop Back Tester 2. Spectrum Analyzer 3. VSA 4. Signal Generator 5. Chamber 6. Oscilloscope 7. DC Power Supply 8. Multimeter 9. Power Meter/Sensor 10. Waveform Generator 11. Universal Counter MT8850A E4405B 89640A E4432B SU-240 54624A E3631A/E3632A 34401A E4416A/ E9326A 33250A 53131A Anritsu Agilent Agilent Agilent Espec Agilent Agilent Agilent Agilent Agilent Agilent 7 What support the Team can provide 1. Embedded BlueCore designs for Mobile Phone, PDA etc. 2. Design Review and Testing 3. Reference Design by using specific PCB design rules by using specific components 4. Production Test & Bluetooth Qualification Japan, Korea, Taiwan, China and all of Asian customers 8 Fast Track Bluetooth® Hardware Technical Seminar Presentation September 2003 9 Class2 Example Design CSR Support Home Page http://support.csr.com/index.php RF Designs & Guidelines •BlueCore2-ROM Class 2 Example Design DEV-PC-1241B (bc2r41b-an-001Pa) with Soshin filter •BlueCore2-ROM Class 2 Example Design DEV-PC-1251B (bc2r51b-an-001Pa) with Epcos filter 10 CSR Japan Reference Design (1st trial) Application PCB (65mm x 36mm) Nick-Nack MuRata matched Balun-Filter BlueCore Area : 67sq mm (10.3mm x 6.5mm) 11 Nick-Nack Reference Design Schematic 12 Nick-Nack Reference Design Component Layout 13 Nick-Nack Reference Design Bill Of Materials Circuit Ref. Description Value Tol Voltage Material Package PCB 4 Layer FR4 U1 BlueCore3_Nick-Nack CMOS BGA6x6 U2 RF Balun-Bandpass Filter 2.45GHz Ceramic 0805 C1 CERAMIC CAPACITOR 18p +/-0.25pF 50V COG 0402 C2 CERAMIC CAPACITOR 15p +/-0.25pF 50V COG 0402 C3, C4, C10 CERAMIC CAPACITOR 10n +80/-20% 50V X7R 0402 C5 CERAMIC CAPACITOR 2u2 +80/-20% 16V X7R 0805 R1 THICK FILM RESISTOR 2R2 5% 0402 L1 Thin Film INDUCTOR 22n +/-5% 0402 14 CSR Japan Reference Design (1st trial) Board Build Information 15 CSR Standard Reference Circuit (RF) Band Pass Filter Matching Circuit Balun BlueCore 16 Balun-Filter (50ohm type) Matching Circuit TDK DEA252450BT-7001A1 BlueCore Balun-Filter 17 Balun-Filter (Matching Type) No Matching Circuit Needed Balun-Filter 18 Balun-Filter by Japanese Filter Makers Balanced Port Impedance Matched to Matched to 50 ohm BlueCore (BGA) BlueCore (CSP) SOSHIN a a ? MuRata a a ? TDK a * ? KYOCERA * * ? b : Sample available * : Under development 19 “How Easy Can It Be?” BC2ROM_BGA BlueCore CSR Standard Circuit Area Reduction BlueCore Nick-Nack MuRata matched Balun-Filter 20 The Most Smallest Bluetooth in the World CONFIDENTIAL 21 Questions? 22 Generic Production Test Technical Seminar Presentation September 2003 23 Agenda • Introduction • Test Flow • Preparation • RF Testing • Digital Testing • Final Configuration • System Testing • OQM Testing • Test Software 24 Introduction • What is production testing? – Test Bluetooth® device assembled correctly – Configure device • CSR’s aim to help: – Advise on test strategies – Advise on test equipment – Reduce test time – Reduce development time 25 Test Flow PCBTest Bare PCB Assembled Product Preparation Board Test System Test Ship Product Assembly 26 Preparation • BlueCore2-Flash • BlueCore2-External – Program flash • BlueCore2-ROM – Prepare EEPROM – Prepare for testing 27 Preparation • Flash programming – Configure device ready to test • Correct firmware • Correct application • Design specific settings – Verified and passed into production phase – BlueCore™ - converted to Persistent Store settings • “Ready to test” settings – Persistent Store settings to allow the device to be tested – Programming methods • Pre-program flash (BlueCore2-External) • Serial Peripheral Interface – Simplex – Multiplex 28 Preparation • Preparing EEPROM – Write header information to EEPROM device • Using BCCMD command E2_device via UART/USB/SPI – If required, allocate space for VM application on EEPROM • Using BCCMD command E2_app_size via UART/USB/SPI – If required, load VM application onto EEPROM • Using BCCMD commands E2_app_data via UART/USB/SPI – Load any additional Persistent Store settings into EEPROM • Using BCCMD Persistent Store access commands via UART/USB/SPI 29 Preparation • End result – Ready to test module – Correct Persistent Store settings – Correct firmware – Correct application 30 RF Testing • CSR can supply two example test plans. Customers can choose either: – Configurable test plan • Using CSR’s built-in tests – Combination test plan • Using combination of CSR’s built-in tests and Bluetooth testmode • Choice of test plan depends on equipment 31 RF Testing – Configurable Test Plan • Equipment – Test PC – Spectrum analyser – Signal generator • Can be replaced by a calibrated BlueCore reference module – Test fixture 32 RF Testing – Configurable Test Test PC USB / UART Test application CSR DLLs Test equipment drivers CSR supplied GPIB / serial Device under test Test fixture Spectrum Analyser Signal generator Test chamber (radiated tests only) Power Power supply 33 RF Testing – Configurable Test Plan • Configure crystal trim – Determine that the output frequency is within design limits: • Transmit a continuous tone at fixed frequency • Alter crystal trim value until output is on frequency • Write final value to the Persistent Store • Various algorithms to use (radically affect test time) – Example 1: “Brute force” approach • Measure frequency of every trim value (0 to 63) and choose the best • Approximately 12 seconds – Example 2: Simple search • Using step sizes of 10 step through xtal trim values until frequency offset switches sign (-ve to +ve or vice versa) • Step back through the last 10 values and find the best • Average test time 5.13 seconds – Example 3: Binary search • Average test time 1.73 seconds 34 Frequency Offset (kHz) RF Testing – Configurable Test Plan Crystal Trim Frequency Offsets 6 5 4 3 2 1 0 1 3 5 7 9 11 13 15 17 19 21 23 25 27 29 31 33 35 37 39 41 43 45 47 49 51 53 55 57 59 61 -1 Crystal Trim Value 35 RF Testing – Configurable Test Plan • Measure TX power – Check RF path and external RF components – Using spectrum analyser and built-in test TXDATA1 • Measure at centre frequency and band edges • Check power is within design limits – Measure at three channels • Uses TXDATA1 and measures power at 2402MHz, 2441MHz and 2480MHz • Spectrum analyser set-up – Zero span – Single sweep – Peak search • Average test time (all three channels) 2.29 seconds (SD 0.08) 36 RF Testing – Configurable Test Plan 37 RF Testing – Configurable Test Plan • Bit Error Rate test – Check RX path and external components • On Class 2 modules this test can be removed, however bit error rate will be affected by poor power supplies – Using signal generator and BIT_ERROR1 • Signal generator transmits DH1 packets with PRBS9 payload at fixed frequency – Transmit at required power level such that signal strength at the receiver at required sensitivity – For BlueCore2 Class 2 reference module -85dBm • Determine if bit error rate at the receiver is within required limits – Bluetooth specifies 0.1% – Example 1: DH1 packets, 1.6MBits across three channels • Average test time 12.29 seconds (SD 0.003) per channel – Example 2: DH1 packets, 160kBits across three channels • Average test time 4.29 seconds (SD 0.003) – 10,000 bits the most common choice 38 RF Testing – Configurable Test Plan • Additional tests can be easily developed – If required by design • Measure LO suppression – Average test time 1.43 seconds (SD 0.020) • Offset configuration – Average test time 2.53 seconds (SD 0.054) • Phase noise – Average test time 2.91 seconds (SD 0.062s) • RF sideband – Average test time 3.87 seconds (SD 0.091s) • Further tests can be easily designed 39 RF Testing – Combination Test Plan • Equipment – Test PC – Loopback tester • R&S CMU200 • Anritsu MT8850A • Agilent E1852B – Test fixture 40 RF Testing – Combination Test Plan Test PC USB / UART Test application CSR DLLs Test equipment drivers CSR supplied GPIB / serial Device under test Test fixture Bluetooth loopback tester Test chamber (radiated tests only) Power Power supply 41 RF Testing – Combination Test Plan • Configure crystal trim – As for Configurable Test Plan – Loopback tester needs to be capable of measuring frequency • CMU 200 – built-in spectrum analyser • E1852B – measure frequency offset • MT8850B – measure carrier frequency 42 RF Testing – Combination Test Plan • Enable Bluetooth testmode using – HCI_SET_EVENT_FILTER – HCI_WRITE_SCAN_ENABLE – HCI_ENABLE_DEVICE_UT_MODE • Replaced by DM commands – RFC stack – HID stack – VM **MUST** be disabled to call from host • Most testers use R0 page mode where BlueCore defaults to R1 – This combination will produce a rate of around 25% failure to connect – Change the tester to use R1 to overcome 43 RF Testing – Combination Test Plan • Output power • Initial carrier frequency • Drift • Modulation • Sensitivity 44 RF Testing – Combination Test Plan • Test times – Dependent on test equipment 45 Digital Testing • Equipment – Test PC – Test fixture – Audio test equipment (if required) 46 Digital Testing • Check PIO operation – Connectivity • Check PCM operation – Connectivity – Quality 47 Configuration • Program Persistent Store values – Set variables • Bluetooth address • Serial number • Local name • Crystal trim – Set-up for final use depends on end-customer’s requirements • Enable VM • Set correct host interface 48 System Testing • Test of finished product – Fitting of module to final PCB • Check connections • Final configuration – Fitting of antenna – Check for damage caused by fitting plastics • Design dependent – Check button and LED operation – Check PCM and audio interface 49 OQM Testing • Output Quality Monitoring – Sample from the production line – Perform a more in-depth set of RF and digital tests – This can take several forms: • Sub-set of Bluetooth qualification tests • Full functional soak tests • Combinations of above – Sample size determined by QA methodology • MIL-STD-105D 50 Test Software • Currently test and configuration commands are sent from a host device – Host PC – Host microcontroller – VM (Only Bluetooth testmode) • CSR can support the development of a test application 51 Test Software • Example software to help – BlueFlash and BlueFlashCmd – TestFlash – TestEngine – BlueTest / BlueChat source code 52 Test Software • BlueFlash / BlueFlashCmd – Use SPI interface to communicate with BlueCore processor – Used to load flash – Available to use • Source not freely released – BlueFlashCmd used with gang-programmer 53 Test Software • TestFlash – TestFlash provides simple interface to flash loading DLLs • Simple function calls • Fast development time re-using CSR DLLs • With support for gang-programming – CSR can provide DLLs, header and library files • All required to develop a production test system quickly • To be released with BlueSuite™ on CSR website – Supports various programming languages • C/C++ • Visual Basic • LabView 54 Test Software • TestEngine – TestEngine provides simple interface to host side DLLs • Simple function calls • Fast development time re-using CSR DLLs • Now with limited DM support – CSR can provide DLLs, header and library files • All required to develop a production test system quickly • Released with BlueSuite on CSR website – Supports various programming languages • C/C++ • Visual Basic • LabView 55 Test Software Factory Production test application TestEngine HCI BCSP H4 USB Test equipment drivers Data logging CSR supplied Customer supplied 3rd party supplied 56 Test Software • Re-use BlueTest / BlueChat source – Can be used to write a Windows® program • Longer development time • Easier to use TestEngine – Can be used as a reference for developing software for a microcontroller 57 Questions? 58

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