This paper describes a fast and accurate simulatorfor characterizing the effects of substrate coupling on integrated-circuit performance. The technique uses the electrostatic Greenfunction of the substrate medium and the fast Fourier transformalgorithm. It is demonstrated that this technique is suitable foroptimization of layout for minimization of substrate coupling. Analysis of substrate coupling in different types of substrates andthe utility of guard rings in different types of substrates is alsodiscussed. Experimental verification of the models is presented.
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