Device Structures and Materials for Scaling to Si Limits and BeyondDevice Structures and Materials for Scaling to Si Limits and BeyondKrishna Saraswat Materials Structures and Devices MARCO Focus Research Center1Focus Research Center Program: Time Scale Essential complement to ongoing, nearterm efforts Focus where evolutionary R&D may not find solutionsTechnology scaling0.13m200290nm200465nm200645nm200830-20nm201010nm?2012+current near-term R&D...MARCO FRCP Agenda 2The Four Current Focus CentersDesign and Test Focus CenterDirector: Jan Rabaey, BerkeleyComponent-based design, constructive fabrics, fully programmable systems, test, verification, energy & power, calibrating achievable designsLead School: U.C. BerkeleyCMU MIT Penn State Princeton Purdue Stanford UCLA UC ……
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