电感RELIABILITY TEST CONDITIONSWIRE WOUND CHIP INDUCTORS TYPEFOR SMD322522/453232 / SMTSDR322520/453226 / SMDCHGR0603/0805/1008/1210 /SMDFSR1008 / SMTS | ||Item (項目) |Required |Test Method/Condition (測試 || |Characteristics |方法) || |(要求) | ||High temperature |1.No case deformation|Temperature: 85±2℃ Time : ||Storage test |or |96±2 hours || |change in appearance.|Tested not less than 1 hour,||Reference |2.ΔL/L≦10% |nor more than 2 hours at ||documents: |3.ΔQ/Q≦30% |room temperature. ||MIL-STD-202G Method|4.ΔDCR/DCR≦10% |[pic] ……
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