《Microwave Electronics：Measurement and Materials Characterization》
作者：L. F. Chen，C. K. Ong，C. P. Neo，V. V. Varadan，V. K. Varadan
年份：2004
The development of high speed, high frequency circuits and systems requires an understanding of the properties of materials functioning at the microwave level. This comprehensive reference sets out to address this requirement by providing guidance on the development of suitable measurement methodologies tailored for a variety of materials and application systems.
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