随着集成电路技术的飞速发展以及SOC 系统的出现，电路的测试难度在不断增大，严重制约了SOC 技术的发展，文中从SOC 可测性设计出发全面介绍IEEE P1500，通过研究对比当前适用于SOC 领域的测试方法，着重讨论了其在SOC 测试方面应用的优点和不足。关键词：SOC 可测性设计 IEEE P1500Abstract: Along with the rapid development of IC’s technique and the emergenceof SOC system, the test of IC system becomes more difficult and restricts seriouslythe development of SOC. In this paper, from the design for test of SOC, we fullyintroduce IEEE P1500 and discuss its merit and disadvantage when it is used in testingSOC system by researching and comparing some test methods.Keywords: SOC, design for test, IEEE P1500
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