(V = 3.3 V 5%, R frequency = externalwith REFCLKclock frequency = 30atMHz with
REFCLK Multiplier enabled at 10 for AD9854ASQ, external reference clock
20 MHz
Multiplier enabled 10 for
S
SET
AD9854AST unless otherwise noted.)
Parameter
REF CLOCK INPUT CHARACTERISTICS
1
Internal Clock Frequency Range
External REF Clock Frequency Range
REFCLK Multiplier Enabled
REFCLK Multiplier Disabled
Duty Cycle
Input Capacitance
Input Impedance
Differential Mode Common-Mode Voltage Range
Minimum Signal Amplitude
Common-Mode Range
V
IH
(Single-Ended Mode)
V
IL
(Single-Ended Mode)
DAC STATIC OUTPUT CHARACTERISTICS
Output Update Speed
Resolution
I and Q Full-Scale Output Current
I and Q DAC DC Gain Imbalance
2
Gain Error
Output Offset
Differential Nonlinearity
Integral Nonlinearity
Output Impedance
Voltage Compliance Range
DAC DYNAMIC OUTPUT CHARACTERISTICS
I and Q DAC Quad. Phase Error
DAC Wideband SFDR
1 MHz to 20 MHz A
OUT
20 MHz to 40 MHz A
OUT
40 MHz to 60 MHz A
OUT
60 MHz to 80 MHz A
OUT
80 MHz to 100 MHz A
OUT
100 MHz to 120 MHz A
OUT
DAC Narrowband SFDR
10 MHz A
OUT
(± 1 MHz)
10 MHz A
OUT
(± 250 kHz)
10 MHz A
OUT
(± 50 kHz)
41 MHz A
OUT
(± 1 MHz)
41 MHz A
OUT
(± 250 kHz)
41 MHz A
OUT
(± 50 kHz)
119 MHz A
OUT
(± 1 MHz)
119 MHz A
OUT
(± 250 kHz)
119 MHz A
OUT
(± 50 kHz)
Residual Phase Noise
(A
OUT
= 5 MHz, Ext. CLK = 30 MHz,
REFCLK Multiplier Engaged at 10×)
1 kHz Offset
10 kHz Offset
100 kHz Offset
(A
OUT
= 5 MHz, Ext. CLK = 300 MHz,
REFCLK Multiplier Bypassed)
1 kHz Offset
10 kHz Offset
100 kHz Offset
Pipeline Delays
Phase Accumulator and DDS Core
Inverse Sinc Filter
Digital Multiplier
Temp
FULL
FULL
FULL
25°C
25°C
25°C
25°C
25°C
25°C
25°C
FULL
25°C
25°C
25°C
25°C
25°C
25°C
25°C
25°C
25°C
25°C
25°C
25°C
25°C
25°C
25°C
25°C
25°C
25°C
25°C
25°C
25°C
25°C
25°C
25°C
25°C
Test
Level
VI
VI
VI
IV
IV
IV
IV
IV
IV
IV
I
IV
IV
I
I
I
I
I
IV
I
IV
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
Min
5
5
5
45
AD9854ASQ
Typ
Max
300
75
300
55
Min
5
5
5
45
AD9854AST
Typ
Max
200
50
200
55
Unit
MHz
MHz
MHz
%
pF
kΩ
mV p-p
V
V
V
MSPS
Bits
mA
dB
% FS
µA
LSB
LSB
kΩ
V
Degrees
dBc
dBc
dBc
dBc
dBc
dBc
dBc
dBc
dBc
dBc
dBc
dBc
dBc
dBc
dBc
50
3
100
50
3
100
800
1.6
2.3
1.75
1.9
1
300
800
1.6
2.3
1.75
1.9
1
200
5
–0.5
–6
12
10
+0.15
0.3
0.6
100
–0.5
0.2
58
56
52
48
48
48
83
83
91
82
84
89
71
77
83
20
+0.5
+2.25
2
1.25
1.66
+1.0
1
5
–0.5
–6
12
10
+0.15
0.3
0.6
100
–0.5
0.2
58
56
52
48
48
20
+0.5
+2.25
2
1.25
1.66
+1.0
1
83
83
91
82
84
89
25°C
25°C
25°C
V
V
V
140
138
142
140
138
142
dBc/Hz
dBc/Hz
dBc/Hz
25°C
25°C
25°C
25°C
25°C
25°C
V
V
V
IV
IV
IV
142
148
152
17
12
10
142
148
152
17
12
10
dBc/Hz
dBc/Hz
dBc/Hz
SysClk Cycles
SysClk Cycles
SysClk Cycles
–2–
REV. 0
AD9854
Parameter
MASTER RESET DURATION
COMPARATOR INPUT CHARACTERISTICS
Input Capacitance
Input Resistance
Input Current
Hysteresis
COMPARATOR OUTPUT CHARACTERISTICS
Logic “1” Voltage, High Z Load
Logic “0” Voltage, High Z Load
Output Power, 50
Ω
Load, 120 MHz Toggle Rate
Propagation Delay
Output Duty Cycle Error
3
Rise/Fall Time, 5 pF Load
Toggle Rate, High Z Load
Toggle Rate, 50
Ω
Load
Output Cycle-to-Cycle Jitter
4
COMPARATOR NARROWBAND SFDR
4
10 MHz (± 1 MHz)
10 MHz (± 250 kHz)
10 MHz (± 50 kHz)
41 MHz (± 1 MHz)
41 MHz (± 250 kHz)
41 MHz (± 50 kHz)
119 MHz (± 1 MHz)
119 MHz (± 250 kHz)
119 MHz (± 50 kHz)
CLOCK GENERATOR OUTPUT JITTER
5
5 MHz A
OUT
40 MHz A
OUT
100 MHz A
OUT
PARALLEL I/O TIMING CHARACTERISTICS
T
ASU
(Address Setup Time to
WR
Signal Active)
T
ADHW
(Address Hold Time to
WR
Signal Inactive)
T
DSU
(Data Setup Time to
WR
Signal Inactive)
T
DHD
(Data Hold Time to
WR
Signal Inactive)
T
WRLOW
(WR Signal Minimum Low Time)
T
WRHIGH
(WR Signal Minimum High Time)
T
WR
(WR Signal Minimum Period)
T
ADV
(Address to Data Valid Time)
T
ADHR
(Address Hold Time to
RD
Signal Inactive)
T
RDLOV
(RD Low-to-Output Valid)
T
RDHOZ
(RD High-to-Data Three-State)
SERIAL I/O TIMING CHARACTERISTICS
T
PRE
(CS Setup Time)
T
SCLK
(Period of Serial Data Clock)
T
DSU
(Serial Data Setup Time)
T
SCLKPWH
(Serial Data Clock Pulsewidth High)
T
SCLKPWL
(Serial Data Clock Pulsewidth Low)
T
DHLD
(Serial Data Hold Time)
T
DV
(Data Valid Time)
CMOS LOGIC INPUTS
Logic “1” Voltage
Logic “0” Voltage
Logic “1” Current
Logic “0” Current
Input Capacitance
Temp
25°C
25°C
25°C
25°C
25°C
FULL
FULL
25°C
25°C
25°C
25°C
25°C
25°C
25°C
25°C
25°C
25°C
25°C
25°C
25°C
25°C
25°C
25°C
25°C
25°C
25°C
FULL
FULL
FULL
FULL
FULL
FULL
FULL
FULL
FULL
FULL
FULL
FULL
FULL
FULL
FULL
FULL
FULL
FULL
25°C
25°C
25°C
25°C
25°C
Test
Level
IV
V
IV
I
IV
VI
VI
I
IV
I
V
IV
IV
IV
V
V
V
V
V
V
V
V
V
V
V
V
IV
IV
IV
IV
IV
IV
IV
V
IV
IV
IV
IV
IV
IV
IV
IV
IV
V
I
I
IV
IV
V
8.2
0
2.1
0
2.2
7
10
15
5
3.1
0.16
9
–10
300
375
11
3
±
1
2
350
400
9
+10
–10
300
375
4.0
84
84
92
76
82
89
73
73
83
23
12
7
7.8
1.6
1.8
8.2
0
2.1
0
2.2
7
10
15
5
84
84
92
76
82
89
73
73
83
23
12
7
7.8
1.6
1.8
11
3
±
1
2
350
400
AD9854ASQ
Min
Typ
Max
10
3
500
±
1
10
AD9854AST
Min
Typ
Max
10
3
500
±
1
10
3.1
0.16
Unit
SysClk Cycles
pF
kΩ
µA
mV p-p
V
V
dBm
ns
%
ns
MHz
MHz
ps rms
dBc
dBc
dBc
dBc
dBc
dBc
dBc
dBc
dBc
ps rms
ps rms
ps rms
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
V
V
µA
µA
pF
±
5
20
±
5
20
+10
4.0
15
15
10
15
15
10
30
100
30
40
40
0
30
2.7
0.4
±
5
±
5
3
30
100
30
40
40
0
30
2.7
0.4
±
12
±
12
3
REV. 0
–3–
AD9854–SPECIFICATIONS
Parameter
POWER SUPPLY
6
+V
S
Current
7
+V
S
Current
8
+V
S
Current
9
P
DISS7
P
DISS8
P
DISS9
P
DISS
Power-Down Mode
Temp
25°C
25°C
25°C
25°C
25°C
25°C
25°C
Test
Level
I
I
I
I
I
I
I
Min
AD9854ASQ
Typ
Max
1050
710
600
3.475
2.345
1.975
1
1210
816
685
4.190
2.825
2.375
50
Min
AD9854AST
Typ
Max
755
515
435
2.490
1.700
1.435
1
865
585
495
3.000
2.025
1.715
50
Unit
mA
mA
mA
W
W
W
mW
NOTES
1
The reference clock inputs are configured to accept a 1 V p-p (minimum) dc offset sine wave centered at one-half the applied V
DD
or a 3 V TTL-level pulse input.
2
The I and Q gain imbalance is digitally adjustable to less than 0.01 dB.
3
Change in duty cycle from 1 MHz to 100 MHz with 1 V p-p sine wave input and 0.5 V threshold.
4
Represents comparator’s inherent cycle-to-cycle jitter contribution. Input signal is a 1 V, 40 MHz square wave. Measurement device Wavecrest DTS – 2075.
5
Comparator input originates from analog output section via external 7-pole elliptic LPF. Single-ended input, 0.5 V p-p. Comparator output terminated in 50
Ω.
6
Simultaneous operation at the maximum ambient temperature of 85
°C
and the maximum internal clock frequency of 200 MHz for the 80-lead LQFP, or 300 MHz
for the thermally-enhanced 80-lead LQFP may cause the maximum die junction temperature of 150
°C
to be exceeded. Refer to the section titled Power Dissipation
and Thermal Considerations for derating and thermal management information.
7
All functions engaged.
8
All functions except inverse sinc engaged.
9
All functions except inverse sinc and digital multipliers engaged.
Specifications subject to change without notice.
EXPLANATION OF TEST LEVELS
Test Level
ABSOLUTE MAXIMUM RATINGS*
I
– 100% Production Tested.
III – Sample Tested Only.
IV – Parameter is guaranteed by design and characterization
testing.
V – Parameter is a typical value only.
VI – Devices are 100% production tested at 25°C and
guaranteed by design and characterization testing
for industrial operating temperature range.
Maximum Junction Temperature . . . . . . . . . . . . . . . . 150°C
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