Semiconductor memory, card readers, microprocessors,disc drives, piezoelectric devices and digitally based systemsfurnish transient loads that a voltage regulator mustservice. Ideally, regulator output is invariant during a loadtransient. In practice, some variation is encountered andbecomes problematic if allowable operating voltage tolerancesare exceeded. This mandates testing the regulatorand its associated support components to verify desiredperformance under transient loading conditions. Variousmethods are employable to generate transient loads, allowingobservation of regulator response
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